As semiconductor designs continue to scale in complexity and integration, ensuring that chips can be tested thoroughly and economically has become a strategic priority. Manufacturing defects, process variations, and subtle design issues can render even functionally correct designs unusable if they are not detected efficiently during production. Design for Testability https://arthurypwxv.win-blog.com/20517759/low-power-design-as-a-core-competency-in-modern-vlsi-engineering